Phonon softening and crystallographic orientation of strained graphene studied by Raman spectroscopy
Phonon softening and crystallographic orientation of strained graphene studied by Raman spectroscopy
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DOI：
10.1073/pnas.0811754106
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发表时间：
2009-05-05
影响因子：
11.1
通讯作者：
Hone, James
中科院分区：
文献类型：
--
作者：
Huang, Mingyuan;Yan, Hugen;Hone, James
我们对可调单轴拉伸应力下石墨烯单层中光学声子的拉曼光谱进行了系统研究。 G 和 2D 波段均表现出显着的红移。由于应变引起的对称性破缺，G 带分裂成 2 个不同的子带（G(+)、G(-)）。 G(+) 和 G(-) 波段的拉曼散射显示出独特的偏振依赖性，反映了应力轴与下面的石墨烯晶轴之间的角度。因此，偏振拉曼光谱构成了确定石墨烯晶体取向的纯光学方法。
We present a systematic study of the Raman spectra of optical phonons in graphene monolayers under tunable uniaxial tensile stress. Both the G and 2D bands exhibit significant red shifts. The G band splits into 2 distinct subbands (G(+), G(-)) because of the strain-induced symmetry breaking. Raman scattering from the G(+) and G(-) bands shows a distinctive polarization dependence that reflects the angle between the axis of the stress and the underlying graphene crystal axes. Polarized Raman spectroscopy therefore constitutes a purely optical method for the determination of the crystallographic orientation of graphene.