Quantitative analysis of surface atom positions in a thick crystal as determined by a reconstructed exit wave.
Quantitative analysis of surface atom positions in a thick crystal as determined by a reconstructed exit wave.
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通过重建的出射波确定厚晶体中表面原子位置的定量分析。
DOI：
10.1093/jmicro/52.4.375
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发表时间：
2003
期刊：
影响因子：
--
通讯作者：
Y. Takai
中科院分区：
文献类型：
--
作者：
T. Kawasaki;M. Taya;Y. Takai
在高分辨透射电子显微镜中，用三维傅里叶滤波方法重建出射波，定量分析了Au（110）2 × 1重建表面的原子结构。为了重建相对较厚晶体中的出射波，本文提出了一个实用的准则。在所提出的标准得到的“伪出口波”，表面原子的弛豫是清晰可见的顶部三层。原子的位移被测量为约5-20 μ π ι。对于原子柱位置的定量分析，使用Au（110）重构表面的结构模型进行图像对比度计算。计算表明，只要样品厚度小于7 nm，即使对于弛豫表面，重建的赝出射波也能直接反映原子柱的位置，精度可达几μ m。
Atomic structures of an Au (110) 2 x 1 reconstructed surface were analysed quantitatively using an exit wave reconstructed by the three-dimensional Fourier filtering method in high-resolution transmission electron microscopy. To reconstruct the exit wave in a relatively thick crystal, a practical criterion was proposed in the present analysis. In the 'pseudo-exit wave' obtained by the proposed criterion, relaxation of surface atoms was clearly visible in the top three layers. The atoms' displacement was measured to be about 5-20 pm. For quantitative analysis of the atom column positions, image contrast calculations were performed using a structural model of the Au (110) reconstructed surface. Calculations confirmed that the reconstructed pseudo-exit wave could represent the atom column positions directly with an accuracy of several pm, even for a relaxed surface, provided the sample thickness was <7 nm.