Crystallization and activation of silicon by microwave rapid annealing
Crystallization and activation of silicon by microwave rapid annealing
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DOI:
10.1007/s00339-016-0220-7
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发表时间:
2016-06
期刊:
影响因子:
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通讯作者:
S. Kimura;Kosuke Ota;M. Hasumi;Ayuta Suzuki;M. Ushijima;T. Sameshima
中科院分区:
文献类型:
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作者:
S. Kimura;Kosuke Ota;M. Hasumi;Ayuta Suzuki;M. Ushijima;T. Sameshima
A combination of the carbon-powder absorber with microwave irradiation is proposed as a rapid heat method. 2-μm-diameter carbon powders with a packing density of 0.08 effectively absorbed 2.45 GHz 1000-W-microwave and heated themselves to 1163 °C for 26 s. The present heat treatment recrystallized n-type crystalline silicon surfaces implanted with-boron and phosphorus atoms with crystalline volume ratios of 0.99 and 0.93, respectively, by microwave irradiation at 1000 W for 20 s. Activation and carrier generation were simultaneously achieved with a sheet resistivity of. A high photo-induced-carrier effective lifetime ofs was also achieved. Typical electrical current-rectified characteristic and solar cell characteristic with an efficiency of 12.1 % underillumination were obtained. Moreover, heat treatment with microwave irradiation at 1000 W for 22 s successfully crystallized silicon thin films with thicknesses ranging from 2.4 to 50 nm formed on quartz substrates. Nano-crystalline cluster structure with a high volume ratio of 50 % was formed in the 1.8-nm (initial 2.4-nm)-thick silicon films. Photoluminescence around 1.77 eV was observed for the 1.8-nm-thick silicon films annealed at 260 °C in-Pa-H2O-vapor for 3 h after the microwave heating.