Study of tip magnetization behavior in magnetic force microscope
Study of tip magnetization behavior in magnetic force microscope
复制标题
磁力显微镜尖端磁化行为研究
DOI：
10.1116/1.585186
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发表时间：
1991
影响因子：
1.4
通讯作者：
F. Sai
中科院分区：
文献类型：
--
作者：
K. Sueoka;K. Okuda;N. Matsubara;F. Sai
采用铁丝和包覆铁两种磁头，研究了磁头端面磁矩的变化规律。这两种针尖所获得的磁头MFM图像显示出截然不同的特征。假设铁丝针尖的磁矩沿针尖轴方向几乎固定，而镀铁针尖的磁矩沿外场方向固定，可以解释这些差异。此外，发现铁涂层尖端的力矩可以响应高达50 MHz的交流励磁头场。
The behavior of the magnetic moment at the tip end of the magnetic force microscope (MFM) was investigated by using two types of tip: iron wire and iron coated. MFM images of a magnetic head obtained by these two tips show quite different features. These differences were explained by assuming that the magnetic moment of the iron wire tip is almost fixed along the tip axis, while that of the iron coated tip follows the external field. In addition, it was found that the moment of the iron coated tip can respond to an ac excited head field of up to 50 MHz.