Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain
Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain
复制标题
DOI：
10.1109/jproc.2014.2332291
复制
发表时间：
2014-08-01
影响因子：
20.6
通讯作者：
Makris, Yiorgos
中科院分区：
文献类型：
--
作者：
Guin, Ujjwal;Huang, Ke;Makris, Yiorgos
由于全球化，电子元件供应链变得更加复杂，零件来自不同的供应商，假冒电子产品已成为一个重大挑战，需要立即解决。目前，有一些标准和程序可以解决此类假冒零件的测试问题。然而，目前还没有足够的研究来解决所有假冒零件的检测和避免问题，这些假冒零件包括回收的、带注释的、过量生产的、克隆的、不合格/有缺陷的以及伪造的文件，这些假冒零件目前已渗透到电子元件供应链中。即使它们最初可以工作，所有这些部件也可能会缩短使用寿命并带来可靠性风险。在本教程中，我们将回顾一些现有的假冒检测和避免方法。我们还将讨论实施这些方法所面临的挑战，以及新的检测和避免机制的开发。
As the electronic component supply chain grows more complex due to globalization, with parts coming from a diverse set of suppliers, counterfeit electronics have become a major challenge that calls for immediate solutions. Currently, there are a few standards and programs available that address the testing for such counterfeit parts. However, not enough research has yet addressed the detection and avoidance of all counterfeit parts-recycled, remarked, overproduced, cloned, out-of-spec/defective, and forged documentation-currently infiltrating the electronic component supply chain. Even if they work initially, all these parts may have reduced lifetime and pose reliability risks. In this tutorial, we will provide a review of some of the existing counterfeit detection and avoidance methods. We will also discuss the challenges ahead for implementing these methods, as well as the development of new detection and avoidance mechanisms.