Gilbert magnetic damping constant of epitaxially grown Co-based Heusler alloy thin films
Gilbert magnetic damping constant of epitaxially grown Co-based Heusler alloy thin films
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DOI：
10.1063/1.3456378
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发表时间：
2010-06
影响因子：
4
通讯作者：
M. Oogane;T. Kubota;Y. Kota;S. Mizukami;H. Naganuma;A. Sakuma;Y. Ando
中科院分区：
文献类型：
--
作者：
M. Oogane;T. Kubota;Y. Kota;S. Mizukami;H. Naganuma;A. Sakuma;Y. Ando
用铁磁共振技术系统地研究了一系列Co2MnAlxSi1−x和Co2FexMn1−xSi Heusler合金外延薄膜的磁阻尼常数。确定的磁阻尼常数大致与第一原理计算的费米能级的态密度成正比。当考虑自旋-轨道相互作用时，计算结果与理论预测一致。除Co2FexMn1−xSi薄膜外，制备的薄膜具有较小的吉尔伯特衰减常数，这可能源于Heusler合金的半金属电子结构。
The magnetic damping constant in a series of Co2MnAlxSi1−x and Co2FexMn1−xSi Heusler alloy epitaxial films were systematically investigated by using ferromagnetic resonance technique. The determined magnetic damping constant is roughly proportional to the density of states at the Fermi energy of the first principle calculation. The result is consistent with the theoretical prediction when taking spin-orbit interaction into account. The small Gilbert damping constant for the fabricated films other than the Co2FexMn1−xSi film with x>0.6 can be originated in the half-metallic electronic structure of Heusler alloys.