A noise model for the evaluation of defect states in solar cells.
A noise model for the evaluation of defect states in solar cells.
复制标题
DOI：
10.1038/srep29685
复制
发表时间：
2016-07-14
影响因子：
4.6
通讯作者：
Pagano S
中科院分区：
文献类型：
--
作者：
Landi G;Barone C;Mauro C;Neitzert HC;Pagano S
建立了一个结合捕获/去捕获和复合机制的理论模型来解释硅基太阳能电池中随机电流波动的起源。在此框架中，暗噪声和光致噪声之间的比较可以确定缺陷态的重要电子参数。据报道，对晶体硅太阳能电池在不同温度和不同照明水平下的电噪声进行了详细分析，包括原始形式和高能质子人工降解后的情况。通过噪声光谱研究主要缺陷特性的演变。
A theoretical model, combining trapping/detrapping and recombination mechanisms, is formulated to explain the origin of random current fluctuations in silicon-based solar cells. In this framework, the comparison between dark and photo-induced noise allows the determination of important electronic parameters of the defect states. A detailed analysis of the electric noise, at different temperatures and for different illumination levels, is reported for crystalline silicon-based solar cells, in the pristine form and after artificial degradation with high energy protons. The evolution of the dominating defect properties is studied through noise spectroscopy.