Transient current testing based on current (charge) integration
Transient current testing based on current (charge) integration
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基于电流（电荷）积分的瞬态电流测试
DOI：
10.1109/iddq.1998.730728
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发表时间：
1998
期刊：
影响因子：
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通讯作者：
C. Hawkins
中科院分区：
文献类型：
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作者：
I. de Paul;R. Picos;J. Rosselló;M. Roca;E. Isern;J. Segura;C. Hawkins
我们评估了一种技术，使用电源充电作为测试观察。根据测量的电源瞬态电流波形计算电荷。数据表明，该方法可以有效地检测阻止电流升高的缺陷（主要是“硬”开路），因此代表了I/sub DDQ/的有效扩展。
We evaluated a technique that uses power supply charge as the test observable. Charge was computed from the measured supply transient current waveform. Data show that this method is efficient to detect those defects that prevent current elevation (mainly "hard" opens) and therefore represents a valid extension of I/sub DDQ/.