Dewetting at the liquid-liquid interface
Dewetting at the liquid-liquid interface
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DOI：
10.1103/physrevlett.76.1110
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发表时间：
1996-02-12
影响因子：
8.6
通讯作者：
Krausch, G
中科院分区：
文献类型：
--
作者：
Lambooy, P;Phelan, KC;Krausch, G
以两种高粘度聚合物为模型体系，研究了液膜与液体基质的脱湿行为与基质粘度的关系。脱湿速度随基质粘度呈极小值变化。这一行为是由于(1)衬底内的传质和(2)液-液界面形变迟缓的竞争所致。原子力显微镜被用来成像液-气界面和埋藏的液-液界面。后者的形状随着底物粘度的增加而发生显著变化。
The dewetting behavior of a liquid film from a liquid substrate has been studied as a function of the substrate viscosity, using two highly viscous polymers as a model system. The dewetting velocity exhibits a minimum as a function of substrate viscosity. This behavior results from the competition of (1) the mass transport in the substrate, and (2) the retarded deformation of the liquid-liquid interface. Atomic force microscopy is used to image both the liquid-air interfaces and the buried liquid-liquid interface. The shape of the latter changes significantly with increasing substrate viscosity.