Method to determine image sharpness and resolution in Scanning Electron Microscopy images

Method to determine image sharpness and resolution in Scanning Electron Microscopy images
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确定扫描电子显微镜图像中图像清晰度和分辨率的方法

DOI:
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发表时间:
2008
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影响因子:
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通讯作者:
G. V. Veen
G. V. Veen
中科院分区:
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文献类型:
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作者:
B. Rieger;G. V. Veen

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图像清晰度对于任何图像的感知质量都非常重要。在某些假设下,锐度可以与分辨率相关。对于SEM图像,其通常位于纳米范围内。如果图像形成被简化为具有点扩散函数(PSF)的线性系统,则我们可以测量系统模糊并且使用(瑞利/阿贝或斯派洛)准则将其与最小可分辨距离相关联。
Image sharpness is very important for the perceived quality of any image. Under certain assumptions sharpness can be related to resolution. For SEM images it lies typically in the nanometer range. If image formation is simplified to a linear system with a point spread function (PSF) we can measure the system blur and relate it to the minimal resolvable distance using a (Rayleigh/Abbe or Sparrow) criterion.
DOI: 10.1016/s0006-3495(04)74193-4
发表时间: 2004-02-01
影响因子: 3.4
作者:
Ober, RJ;Ram, S;Ward, ES
通讯作者: Ward, ES