Analysis of edge birefringence.
Analysis of edge birefringence.
复制标题
边缘双折射分析。
DOI：
10.1016/s0006-3495(91)82092-6
复制
发表时间：
1991
影响因子：
3.4
通讯作者：
Oldenbourg,R
中科院分区：
文献类型：
--
作者：
Oldenbourg,R
我们提出了一个实验和理论研究的边缘双折射现象，出现在边界附近的透明物体，观察高消光和高分辨率偏振光显微镜。作为测试对象，将各向同性KCl晶体的薄片浸入各种折射率的介质中。晶体边缘附近测得的延迟随晶体厚度（在0.3和1微米之间测试）以及晶体（n = 1.49）和浸没液体（n在1.36和1.62之间）之间的折射率差n线性增加。特定的边缘双折射，即，单位厚度和单位折射率差的延迟在边界的高折射率侧为0.029，在低折射率侧为-0.015。通过零双折射的过渡以比光学装置的衍射极限所预测的高得多的精度指定边界的位置。理论研究采用了光线跟踪过程建模的相位和偏振的光线穿过标本的变化。我们发现模型计算和实验结果之间的良好协议表明，边缘双折射可以归因于光的偏振的变化，折射和反射的介电界面。
We present an experimental and theoretical study of the phenomenon of edge birefringence that appears near boundaries of transparent objects which are observed with high extinction and high resolution polarized light microscopy. As test objects, thin flakes of isotropic KCl crystals were immersed in media of various refractive indices. The measured retardation near crystal edges increased linearly with both the crystal thickness (tested between 0.3 and 1 micron), and the difference in refractive indices n between crystal (n = 1.49) and immersion liquids (n between 1.36 and 1.62). The specific edge birefringence, i.e., the retardation per thickness and per refractive index difference, is 0.029 on the high refractive index side of the boundary and -0.015 on the low refractive index side. The transition through zero birefringence specifies the position of a boundary at a much higher precision than predicted by the diffraction limit of the optical setup. The theoretical study employs a ray tracing procedure modeling the change in phase and polarization of rays passing through the specimen. We find good agreement between the model calculations and the experimental results indicating that edge birefringence can be attributed to the change in polarization of light that is refracted and reflected by dielectric interfaces.