Electron microscopy study of C60
Electron microscopy study of C60
复制标题
C60 的电子显微镜研究
DOI：
10.1063/1.105779
复制
发表时间：
1991
影响因子：
4
通讯作者：
D. Yin
中科院分区：
文献类型：
--
作者：
Jian Li;Ziyan Zhao;De;Z. Gan;D. Yin
用扫描显微镜、电子衍射和高分辨电子显微镜研究了粉末C60材料的显微结构特征。扫描电子显微镜观察表明，样品中的晶粒是由广泛无序的微晶以及无定形颗粒填充。电子衍射测试表明，C60晶体具有两种结构，一种是面心立方（fcc）结构，晶胞参数a=1.41 nm;另一种是六方密排（hcp）结构，晶胞参数a=0.958 nm，c=1.63 nm。高分辨电子显微镜以及电子衍射观察清楚地显示随机微晶包装在C60晶粒。
The microstructural features of the powder C60 material have been studied by using scanning microscopy, electron diffraction, and high resolution electron microscopy. Scanning electron microscopy observation reveals that the grains in the samples are packed by extensively disordered crystallites as well as amorphous granules. Electron diffraction measurements have identified that the crystals of C60 have two kinds of structure, one is face‐centered‐cubic (fcc) with unit cell parameter a=1.41 nm, and the other has the hexagonal closest packed (hcp) structure with cell parameters a=0.958 nm and c=1.63 nm. High resolution electron microscopy as well as electron diffraction observations clearly show the random crystallites packing in the C60 grains.