Charge transfer inefficiency increase of the CCD detector induced by proton and neutron irradiations

Charge transfer inefficiency increase of the CCD detector induced by proton and neutron irradiations
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质子和中子辐照引起的 CCD 探测器电荷转移效率低下的增加

DOI:
10.1016/j.nima.2020.164431
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发表时间:
2020
期刊:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
影响因子:
--
通讯作者:
Tongxuan Jia
Tongxuan Jia
中科院分区:
其他
文献类型:
--
作者:
Zujun Wang;Yuanyuan Xue;Rui Xu;Hao Ning;Qianli Jiao;Junwei Li;Lili Ding;Tongxuan Jia

文献摘要

相似文献

电荷转移效率(CTI)是衡量CCD探测器位移损伤性能的重要指标之一。为了帮助用户了解CCD探测器在粒子探测或空间应用中的CTI增加,给出了质子和中子辐照引起的CTI增加。在回旋加速器上用60 MeV的质子进行了3× 1010、5× 1010和7× 1010 p/cm 2注量的质子辐照实验。在中国空间中子源(CSNS)和西安脉冲堆(XAPR)上进行了回流白色中子的中子辐射实验。中子注量率为1× 1011 ~ 1× 1012 n/cm 2。在饱和和半饱和照明的两个信号水平下定量地比较CTIs。还进行了辐照后的退火测试,以观察退化的恢复。还定量比较了退火前后质子或中子辐照引起的CTI增加。详细描述了质子和中子辐照引起的CTI增加。
Charge transfer inefficiency (CTI) is one of the most important parameters to evaluate the performance of a CCD detector caused by displacement damages. In order to help the users to know about the CTI increase of the CCD detectors for applications in particle detection or space applications, the CTI increase caused by proton and neutron irradiations are presented. The proton radiation experiments were carried out at a cyclotron accelerator with 60 MeV protons to the fluences of 3× 10 10, 5× 10 10, and 7× 10 10 p/cm 2. The neutron radiation experiments were carried out at the back-streaming white neutrons at China Spallation Neutron Source (CSNS) and at Xi’an pulse reactor (XAPR). The neutron fluences range from 1× 1 0 11 to 1× 10 12 n/cm 2. The CTIs are quantitatively compared at two signal levels of saturation and half saturation illuminations. The annealing tests after irradiations are also performed to observe the recovery of the degradations. The quantitative comparisons of the CTI increase induced by proton or neutron irradiations before and after annealing are also presented. The CTI increase induced by proton and neutron irradiations is characterized in detail.