Evaluation of the use of Gaussian phi(roz) curves in quantitative electron probe microanalysis: a new optimization
Evaluation of the use of Gaussian phi(roz) curves in quantitative electron probe microanalysis: a new optimization
复制标题
高斯 phi(roz) 曲线在定量电子探针微量分析中的使用评估：一种新的优化
DOI：
10.1002/xrs.1300130211
复制
发表时间：
1984
影响因子：
1.2
通讯作者：
Hjm Hans Heijligers
中科院分区：
文献类型：
--
作者：
Gf Giel Bastin;V. Loo;Hjm Hans Heijligers
基于高斯表达式的x射线深度分布[+(pz)曲线]计算机程序在定量电子探针微量分析中的应用进行了测试。由于最初声称的类似程序的良好结果最初无法复制，因此对其进行了详细分析。因此，提出了对该方法的一些修改。修改后的表达式除了大大提高了计算速度之外，还能更好地了解所涉及的相关数量之间必须存在的微妙平衡。经过一个新的优化过程，修改后的程序在大约450个已发表的微分析上进行了测试。结果表明，+(pz)方法确实是非常有前途的，可以产生一个相对均方根值为5.4%的窄直方图。最后，对今后的改进提出了建议。
A computer program based on the use of Gaussian expressions for the x-ray distribution with depth [+(pz) curves] was tested on its usefulnw for quantitative electron probe microanalysis. As the good results originally claimed for a similar program could not be reproduced initiaUy, it was subjected to a detailed analysis. As a result, some modi6cations in the approach are proposed. Apart from increasing the speed of calculation considerably, the modified expressions provide a better insight into the delicate balance which has to exist between the relevant quantities involved. After a new optimization process the modified program was tested on about 450 published microanalyses. The results show that the +(pz) approach is indeed very promising as a narrow histogram with an r.m.s. value of 5.4% could be produced. Finally, some suggestions are made for future improvements.