Anomalous corrugations in scanning tunneling microscopy: Imaging of individual states.
Anomalous corrugations in scanning tunneling microscopy: Imaging of individual states.
复制标题
扫描隧道显微镜中的异常波纹：各个状态的成像。
DOI：
10.1103/physrevlett.57.440
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发表时间：
1986
影响因子：
8.6
通讯作者：
J. Tersoff
中科院分区：
文献类型：
--
作者：
J. Tersoff
本文解释了在1 T-TaS 2、Si（111）（2 × 1）和石墨的扫描隧道显微镜（STM）图像中观察到的不寻常的波纹，并表明这种波纹是费米面塌陷到表面布里渊区拐角处的一个点的材料的特征。这是低偏置STM图像由电子结构效应而不是表面几何形状主导的第一个明显案例。STM空间分辨率的影响进行了讨论。
Unusual corrugations observed in scanning-tunneling-microscope (STM) images of 1 T-TaS2, Si(111)(2 × 1), and graphite are explained, and are shown to be characteristic of materials where the Fermi surface has collapsed to a point at the corner of the surface Brillouin zone. This is the first clear case where the low-bias STM image is dominated by electronic structure effects rather than surface geometry. Implications for STM spatial resolution are discussed.