Frontside laser fault injection on cryptosystems - Application to the AES' last round -
Frontside laser fault injection on cryptosystems - Application to the AES' last round -
复制标题
密码系统上的前端激光故障注入 - 在 AES 最后一轮中的应用 -
DOI：
10.1109/hst.2013.6581576
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发表时间：
2013
期刊：
影响因子：
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通讯作者：
A. Tria
中科院分区：
文献类型：
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作者：
Cyril Roscian;J. Dutertre;A. Tria
通过IC的前侧（并且因此通过金属填充物）的激光故障注入通常利用中等或小的激光束来执行，以便注入逐字节故障。本文研究了用较大的激光束（在100 μ m范围内）注入缺陷的性质。我们还检查了位设置（或位重置）故障类型是否仍然有效，或者是否会遇到位fip故障类型。在ASIC上运行的高级加密标准（AES）算法的最后一轮期间进行激光注入实验。收集的数据允许调查所获得的故障模型，进行两个常见的差分故障攻击（DFA）计划，并提出一个简单的版本的第三DFA。
Laser fault injection through the front side (and consequently the metal-flls) of an IC is often performed with medium or small laser beams for the purpose of injecting bytewise faults. We have investigated in this paper the properties of fault injection with a larger laser beam (in the 100/im range). We have also checked whether the bit-set (or bit-reset) fault type still holds or whether the bit-fip fault type may be encountered. Laser injection experiments were performed during the last round of the Advanced Encryption Standard (AES) algorithm running on an ASIC. The gathered data allowed to investigate the obtained fault models, to conduct two usual Differencial Fault Attack (DFA) schemes and to propose a simple version of a third DFA.