Femtosecond time-resolved dielectric function measurements by dual-angle reflectometry
Femtosecond time-resolved dielectric function measurements by dual-angle reflectometry
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DOI：
10.1063/1.1582383
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发表时间：
2003-07-01
影响因子：
1.6
通讯作者：
Mazur, E
中科院分区：
文献类型：
--
作者：
Roeser, CAD;Kim, AMT;Mazur, E
提出了一种在较宽的光子能量范围内以飞秒时间分辨率测量材料介电函数的方法。测量了两个入射角下的绝对反射率，并通过类菲涅耳公式的数值反演计算了epsilon(Omega)。利用白光产生，单色探头从近红外展宽到近紫外光，但保持了飞秒时间分辨率。讨论了仪器的标定和误差分析。最后，给出了各向同性、薄膜和单轴材料的测量结果，并与纯反射率研究进行了比较，以说明该技术的优点。(C)2003年美国物理研究所。
We present a technique to measure the dielectric function of a material with femtosecond time resolution over a broad photon energy range. The absolute reflectivity is measured at two angles of incidence, and epsilon(omega) is calculated by numerical inversion of Fresnel-like formulas. Using white-light generation, the single-color probe is broadened from the near IR to the near UV, but femtosecond time resolution is maintained. Calibration of the apparatus and error analysis are discussed. Finally, measurements of isotropic, thin film, and uniaxial materials are presented and compared to reflectivity-only studies to illustrate the merit of the technique. (C) 2003 American Institute of Physics.