Absolute photoionization cross sections with ultra-high energy resolution for Ar, Kr, Xe and N2 in inner-shell ionization regions
Absolute photoionization cross sections with ultra-high energy resolution for Ar, Kr, Xe and N2 in inner-shell ionization regions
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DOI：
10.1016/j.elspec.2007.06.003
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发表时间：
2007-08-01
影响因子：
1.9
通讯作者：
Saito, N.
中科院分区：
文献类型：
--
作者：
Kato, M.;Morishita, Y.;Saito, N.
用多电极电离室和单色化同步辐射测量了Ar、Kr、N2和N2在内壳层电离区的高分辨绝对光电离截面。靶气体的入射光子的能量范围如下：Ar：242-252 eV（2 p里德伯激发），Kr：1650-1770 eV（接近2 p电离阈值），电子伏特：665-720 eV（接近3d电离阈值）和880-1010 eV（接近3 p电离阈值），N-2：400-425 eV（N是激发和电离）。首次测量了Ar、Kr、N2和N2在现有能量范围内的绝对电离截面，能量分辨率超过10，000。根据所测得的截面，得到了Ar原子的2 p（3/2）（-1 4s），2 p（3/2）（-1 3d），2 p（3/2）（-1 4d）和2 p（1/2）（-1 4s）共振态，Ar原子的3d（5/2）（-1 6p）共振态和N-2原子的1 s（-1）π（g）*（v' = 0）共振态的自然寿命宽度.利用Rydberg公式计算了Ar+（2 p（3/2）（-1））、Ar+（2 p（1/2）（-1））和Ar+（3d（5/2）（-1））离子态的电离能。(C)2007 Elsevier B. V.保留所有权利。
The high-resolution absolute photoionization cross sections for Ar, Kr, Xe and N-2 in the inner-shell ionization region have been measured using a multi-electrode ion chamber and monochromatized synchrotron radiation. The energy ranges of the incident photons for the target gases were as follows: Ar: 242-252 eV (2p Rydberg excitation), Kr: 1650-1770 eV (near the 2p ionization thresholds), Xe: 665-720 eV (near the 3d ionization thresholds) and 880-1010 eV (near the 3p ionization thresholds), N-2: 400-425 eV (N Is excitation and ionization). It is the first time to measure the absolute ionization cross sections of Ar, Kr, Xe and N-2 over the present energy ranges with the energy resolution of over 10,000. The natural lifetime widths of 2p(3/2)(-1)4s, 2p(3/2)(-1)3d, 2p(3/2)(-1)4d and 2p(1/2)(-1)4s resonances for Ar, 3d(5/2)(-1)6p resonance for Xe, and 1s(-1) pi(g)* (v' = 0) resonance for N-2 have been obtained based on the cross sections determined. The ionization energies into the Ar+ (2p(3/2)(-1)), Ar+ (2p(1/2)(-1)) and Xe+ (3d(5/2)(-1)) ionic states are also determined using the Rydberg formula. (C) 2007 Elsevier B.V. All rights reserved.