Pressure induced phase transformation of semiconductor clathrates
Pressure induced phase transformation of semiconductor clathrates
复制标题
半导体包合物的压力诱导相变
DOI:
10.1016/j.jpcs.2009.12.042
复制
发表时间:
2010
影响因子:
4
通讯作者:
H. Shimizu
中科院分区:
文献类型:
--
作者:
T. Kume;S. Sasaki;H. Shimizu
Pressure induced phase transformation and amorphization for Ge-based type-I clathrates have been investigated by means of synchrotron XRD and Raman experiments under high pressure. The XRD results of Sr8Ga16Ge30, Ba8Ga16Ge30, and I8Sb8Ge38demonstrated volume collapse phase transitions at 18, 33, and 42GPa, respectively. Reitveld analyses performed for I8Sb8Ge38reveal a deformation of six-member rings of 14-hedron cages with increasing pressure.
DOI:
--
发表时间:
2009
期刊:
Journal of Applied Physics 105-4
影响因子:
--
作者:
H.Shimizu;et al
通讯作者:
et al
DOI:
--
发表时间:
2006
期刊:
Phys.Rev.B 74
影响因子:
--
作者:
C.Liu;T.Nakajima;T.Sakka;and H.Oheaki;C.Liu and T.Nakajima;M. A. Avila;Y. Takasu;I. Ishii;K. Suekuni;R. A. Ribeiro;Y. Takasu;I.Ishii;Y.Takasu;M.A.Avila;Y.Takasu
通讯作者:
Y.Takasu
影响因子:
1.8
作者:
A. Miguel;A. Merlen;P. Toulemonde;T. Kume;S. Floch;A. Aouizerat;S. Pascarelli;G. Aquilanti;O. Mathon;T. Bihan;J. Itié;S. Yamanaka
通讯作者:
A. Miguel;A. Merlen;P. Toulemonde;T. Kume;S. Floch;A. Aouizerat;S. Pascarelli;G. Aquilanti;O. Mathon;T. Bihan;J. Itié;S. Yamanaka