Electro-mechanical modeling of Nb3Sn CICC performance degradation due to strand bending and inter-filament current transfer
Electro-mechanical modeling of Nb3Sn CICC performance degradation due to strand bending and inter-filament current transfer
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DOI：
10.1016/j.cryogenics.2009.08.007
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发表时间：
2010-03
期刊：
影响因子：
2.1
通讯作者：
Y. Zhai
中科院分区：
文献类型：
--
作者：
Y. Zhai
