Accurate microwave technique of surface resistance measurement of large-area HTS films using sapphire quasi-optical resonator
Accurate microwave technique of surface resistance measurement of large-area HTS films using sapphire quasi-optical resonator
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DOI：
10.1109/tasc.2003.812400
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发表时间：
2003-07
影响因子：
1.8
通讯作者：
N. Cherpak;A. Barannik;Y. Filipov;Y. Prokopenko;S. Vitusevich
中科院分区：
文献类型：
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作者：
N. Cherpak;A. Barannik;Y. Filipov;Y. Prokopenko;S. Vitusevich
我们开发了一种利用带高温超导端板的准光学介质谐振器（QDR）测量大面积高温超导（HTS）薄膜表面电阻（R/sub /s）的方法。在该技术中，在夹在高温超导薄膜之间或一块高温超导薄膜与一块铜端板之间的蓝宝石盘中，在k波段激发出最高Q模式，即耳语廊模式。报道了52 mm直径优质YBCO薄膜表面电阻的测量结果。测量结果表明，该技术对大面积薄膜的R/sub /s -进行精确测量是可行的。该方法与经典的基于dr的微波技术类比，适用于毫米波频率下的R/sub /s /的标准测量，但基于qdr的技术存在一些根本性的差异。
We have developed a surface resistance (R/sub s/) measurement technique for large-area high-temperature superconducting (HTS) films using quasioptical dielectric resonators (QDR) with HTS endplates (quasioptical Hakki-Coleman resonators). In this technique, the highest Q modes, namely whispering-gallery modes, in sapphire disk sandwiched between HTS films or between one HTS film and one Cu endplate are excited at K-band frequencies. The authors report on measurement results of surface resistance of 52 mm diameter high-quality YBCO thin films. The measurement results revealed that the technique is feasible for accurate R/sub s/-measurements of large-area thin films. The method is appropriate for standard measurement of R/sub s/ at millimeter wave frequencies by analogy with classic DR-based microwave technique, although QDR-based technique has some fundamental differences.