Measurement of residual elastic strain and lattice rotations with high resolution electron backscatter diffraction
Measurement of residual elastic strain and lattice rotations with high resolution electron backscatter diffraction
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DOI：
10.1016/j.ultramic.2011.05.007
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发表时间：
2011-07-01
期刊：
影响因子：
2.2
通讯作者：
Wilkinson, A. J.
中科院分区：
文献类型：
--
作者：
Britton, T. B.;Wilkinson, A. J.
一组动态模拟的电子背散射图案（EBSP）的α-Ti晶体逐步旋转1度的步骤进行了分析，使用互相关，以确定图像的位移，从应变和旋转计算。在较大的旋转时，互相关在EBSP的某些区域中失败，在这些区域中产生大的移位。这些不正确的移位阻止标准最小二乘误差程序获得应变和旋转的有效解，其中所施加的旋转超过类似于8度。使用稳健的迭代拟合例程，即使不正确地测量了一些图像偏移，也可以针对高达并包括类似于11度的应用旋转获得可靠的应变和旋转。最后，高分辨率电子背散射衍射已被用来分析残余弹性应变，晶格旋转和存储的几何必要的位错在变形到10%的总应变的铜样品的密度。鲁棒的迭代拟合分析允许对较大比例的地图进行可靠的分析，这种差异在已经产生显著的晶格旋转的区域中是最明显的有益的。(c)2011 Elsevier B. V.保留所有权利。
A set of dynamically simulated electron backscatter patterns (EBSPs) for alpha-Ti crystals progressively rotated by 1 degrees steps were analysed using cross-correlation to determine image shifts from which strains and rotations were calculated. At larger rotations the cross-correlation fails in certain regions of the EBSP where large shifts are generated. These incorrect shifts prevent standard least square error procedures from obtaining a valid solution for the strain and rotation, where the applied rotation exceeds similar to 8 degrees. Using a robust iterative fitting routine reliable strains and rotations can be obtained for applied rotations of up to and including similar to 11 degrees even though some image shifts are measured incorrectly. Finally, high resolution electron backscatter diffraction has been used to analyse the residual elastic strain, lattice rotations and density of stored geometrically necessary dislocations in a sample of copper deformed to 10% total strain. The robust iterative fitting analysis allows reliable analysis of a larger proportion of the map, the difference being most obviously beneficial in regions where significant lattice rotations have been generated. (c) 2011 Elsevier B.V. All rights reserved.