Optical characterization of ultrasmall Si nanoparticles prepared through electrochemical dispersion of bulk Si.
Optical characterization of ultrasmall Si nanoparticles prepared through electrochemical dispersion of bulk Si.
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通过电化学分散体硅制备的超小硅纳米颗粒的光学表征。
DOI:
10.1021/jp052214e
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发表时间:
2005
期刊:
影响因子:
--
通讯作者:
Braun,PaulV
中科院分区:
文献类型:
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作者:
Eckhoff,DeanA;Sutin,JasonDB;Clegg,RobertM;Gratton,Enrico;Rogozhina,ElenaV;Braun,PaulV
Studying the properties and stability of silicon nanoparticles (Si-np) in aqueous environments may lead to novel applications in biological systems. In this work, we use absorption and photoluminescence (PL) spectroscopy to characterize ultrasmall Si-np prepared through anodic etching and ultrasonic fractionation of a crystalline Si wafer. Their behavior is studied over time in 2-propanol and during treatments with water, NaOH, HCl, and H2O2. The observed population is divided into two types of material: bright species consisting of well-etched Si-np, ∼1 nm in diameter, and dark species derived from partially etched or aggregated Si structures. The dark material is seen by its scattering in the 2-propanol and water solutions and is largely removed via precipitation with the NaOH or HCl treatment. The bright material includes three distinct species with their respective emissions in the UV−B, UV−A, and hard-blue regions of the spectrum. The hard-blue PL is shown to have a simple pH dependence with a pKa∼3, providing an important insight into its chemical origin and signaling for possible application of Si-np as environmental probes. Our results offer some potential for tailoring the PL properties of ultrasmall Si-np through control of their surface chemistry.