Microstructure Evolution of AlN: Eu Films at Different Annealing Temperatures

Microstructure Evolution of AlN: Eu Films at Different Annealing Temperatures
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DOI:
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发表时间:
2023
期刊:
Phys. Status Solidi A
影响因子:
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通讯作者:
Ke Xu
Ke Xu
中科院分区:
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文献类型:
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作者:
Chunpeng Li;Xionghui Zeng;Xiaodan Wang;Xiaodong Gao;Hongmin Mao;Xiaoming Dong;Yi Zhang;Jiafan Chen;Ke Xu

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