Tomography in the multiple scattering regime of the scanning transmission electron microscope
Tomography in the multiple scattering regime of the scanning transmission electron microscope
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DOI：
10.1063/1.1579116
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发表时间：
2003-06-02
影响因子：
4
通讯作者：
Levine, ZH
中科院分区：
文献类型：
--
作者：
Levine, ZH
迄今为止，几乎所有的断层扫描的基础上，电子显微镜已进行样品1妈妈或更薄。它也依赖于比尔定律。在这项工作中，断层重建的光子带隙晶体的模拟扫描的基础上，明场成像与扫描透射电子显微镜假设（1）多重散射或（2）标准的比尔定律模型。结果表明，它应该是可能的，以处理系统比那些出现在文献中的几倍，虽然在一个更差的分辨率。多重散射理论导致高质量的重建。尽管比尔定律的应用超出了其有效范围，但它的表现只会稍微差一点。
To date, nearly all tomography based on electron microscopy has been performed on samples 1 mum or less thick. It has also relied on Beer's Law. In this work, tomographic reconstructions of simulated scans of a photonic band-gap crystal based on bright-field imaging with a scanning transmission electron microscope are made assuming (1) multiple scattering or (2) the standard Beer's Law model. The results suggest that it should be possible to treat systems several times larger than those which appear in literature, albeit at a worse resolution. The multiple scattering theory leads to high-quality reconstructions. Beer's Law does only a little worse despite being applied outside its range of validity.