Design, preparation, and durability of TiO2/SiO2 and ZrO2/SiO2 double-layer antireflective coatings in crystalline silicon solar modules
Design, preparation, and durability of TiO2/SiO2 and ZrO2/SiO2 double-layer antireflective coatings in crystalline silicon solar modules
复制标题
DOI：
10.1016/j.solener.2012.12.011
复制
发表时间：
2013-03
期刊：
影响因子：
6.7
通讯作者：
Jia Li;Yuehui Lu;P. Lan;Xianpeng Zhang;W. Xu;R. Tan;Weijie Song;K. Choy
中科院分区：
文献类型：
--
作者：
Jia Li;Yuehui Lu;P. Lan;Xianpeng Zhang;W. Xu;R. Tan;Weijie Song;K. Choy
本文采用数值计算和实验相结合的方法，建立了太阳能玻璃上四分之一波、四分之一半波和非四分之一波双层tio2 - sio2和zro2 - sio2增透膜（arc）的最佳光伏透过率（Tpv）和耐用性。基于4×4传播矩阵法的数值计算表明，非四分之一波双层电弧比四分之一波和四分之一半波双层电弧具有更高的tpv值。计算值与实验tpv值吻合较好。例如，溶胶-凝胶法制备的非四分之一波双层tio2 - sio2和ZrO2-SiO2ARCs的tpvv值分别达到94.4±0.1%和94.3±0.1%。在涂层耐久性方面，太阳能玻璃上具有致密和较厚的tio2或zro2阻挡层的非四分之一波双层涂层在高加速温湿度应力测试（HAST） 96h后的tpv降低小于1%，而工业上使用的标准单层多孔sio2在相同的HAST条件下测试后48h大于（15.4%）。非四分之一波tio2 - sio2或zro2 - sio2ar镀膜玻璃封装的单晶Si组件更耐用，在经过48小时的HAST后，效率仅下降不到10%，而单层多孔sio2ar镀膜玻璃封装的Si组件在效率上有明显的损失（约为10%）。21.8%)。
This paper reports the use of a combination of numerical calculations and experimental work to establish the optimum photovoltaic transmittance (Tpv) and durability of the quarter wave, the quarter-half wave, and the non-quarter wave double-layer TiO2–SiO2and ZrO2–SiO2antireflective coatings (ARCs) on solar glass towards practical photovoltaic applications. Numerical calculations based on 4×4 propagation matrix method indicated that the non-quarter wave double-layer ARCs exhibited higher Tpvvalues than those of the quarter wave and the quarter-half wave ARCs. Such calculated values are in good agreement with the experimental Tpvvalues. For examples, the Tpvvalues for the non-quarter wave double-layer TiO2–SiO2and ZrO2–SiO2ARCs prepared by sol–gel reached 94.4±0.1% and 94.3±0.1%, respectively. In terms of the coating durability, the non-quarter wave double-layer coatings with a dense and thicker TiO2or ZrO2barrier layer on solar glass exhibited less than 1% reduction in Tpvafter 96h highly-accelerated temperature and humidity stress test (HAST), as compared with the standard single-layer porous SiO2used in industry which tested in the same HAST conditions to be greater than (15.4%) after 48h. Single crystalline Si modules encapsulated by the non-quarter wave TiO2–SiO2or ZrO2–SiO2AR-coated glass are more durable, with only less than 10% degradation in efficiency after 48h HAST, as compared with Si modules encapsulated by single-layer porous SiO2AR-coated glass which have signification loss in efficiency (circa. 21.8%).