Calculating material criticality of transparent conductive electrodes used for thin film and third generation solar cells
Calculating material criticality of transparent conductive electrodes used for thin film and third generation solar cells
复制标题
DOI：
10.1109/pvsc.2014.6925186
复制
发表时间：
2014-06
期刊：
影响因子：
--
通讯作者：
R. Jarrett;D. Dawson;K. Roelich;Phillip Purnell
中科院分区：
文献类型：
--
作者：
R. Jarrett;D. Dawson;K. Roelich;Phillip Purnell
供应风险和供应短缺的风险正成为考虑大规模低碳技术推广的一个重要因素。本研究采用电流临界研究，分析单一原材料的临界，并将其扩展到计算多种材料透明导电电极（TCE）的相对临界。它将计算出的临界与TCE的Haacke值进行了比较。研究发现，最近开发的用于取代常用氧化铟锡的TCEs，如氟掺杂氧化锡和银纳米线，可以具有更高的临界性，即使材料本身目前较便宜。
The supply risk and exposure to supply shortage is becoming an important factor in the consideration of a mass low carbon technology roll-out. This study takes current criticality studies, which analyse the criticality of single raw materials, and extends it to calculate the relative criticality of multiple material transparent conductive electrodes (TCE). It compares the calculated criticality with the TCE's Haacke figure of merit. It is found that more recent TCEs developed to replace the commonly used indium tin oxide, such as flurine doped tin oxide and silver nanowires, can have a higher criticality, even though the materials themselves are currently less expensive.