Spectral Analysis of Two-Dimensional Contact Problems
Spectral Analysis of Two-Dimensional Contact Problems
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DOI：
10.1115/1.2831303
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发表时间：
1996-04
影响因子：
2.5
通讯作者：
Y. Ju;T. Farris
中科院分区：
文献类型：
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作者：
Y. Ju;T. Farris
接触问题可以通过快速傅里叶变换（FFT）技术转换到空间频率域。频谱分析被用来开发的表面位移和接触压力之间的代数关系。该关系式可用于求出光滑表面接触或粗糙表面完全接触时的接触压力或位移。除了为接触问题提供快速、稳健的解决方案外，代数关系还包含不同长度尺度上表面位移和接触压力之间关系的详细信息。特别是，它示出的频率组成的压力是类似的表面位移的斜率。因此，表面轮廓的高频含量引起高的局部接触压力，在某些情况下，完全接触的奇异压力。然而，测量限制总是导致遗漏表面轮廓的某些高频分量。假设表面轮廓的高频成分服从幂律，频谱分析也被用来估计部分接触参数。该结果将幂律指数与接触压力和隐含的表面完整性联系起来。它的结论是，频谱分析可以结合FFT提供一个有用的技术分类粗糙表面接触。
Contact problems can be converted into the spatial frequency domain using Fast Fourier Transform (FFT) techniques. Spectral analysis is used to develop an algebraic relationship between the surface displacement and the contact pressure. This relationship can be used to find the contact pressure or displacement for the contact of smooth surfaces or the complete contact of rough surfaces. In addition to providing rapid, robust solutions to contact problems, the algebraic relationship contains details of the relationship between surface displacement and contact pressure on different length scales. In particular, it is shown that the frequency composition of pressure is similar to that for slope of the surface displacement. Thus, the high frequency content of the surface profile gives rise to high localized contact pressure, in some cases singular pressure for complete contact. However, measurement limitations always lead to the omission of certain high frequency components of the surface profile. Assuming that the high frequency content of the surface profile obeys a power law, spectral analysis is also used to estimate partial contact parameters. This result relates the exponent of the power law to the contact pressure and implied surface integrity. It is concluded that spectral analysis can be combined with the FFT to provide a useful technique for classifying rough surface contacts.