Determination of Anisotropic Diamagnetic Susceptibility Using X-ray Diffraction
Determination of Anisotropic Diamagnetic Susceptibility Using X-ray Diffraction
复制标题
使用 X 射线衍射测定各向异性抗磁化率
DOI：
10.1143/jjap.51.040202
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发表时间：
2012
期刊：
影响因子：
--
通讯作者：
and F. Kimura
中科院分区：
文献类型：
--
作者：
T. Kimura;G. Song;K. Matsumoto;K. Fujita;and F. Kimura
本文提出了一种通过X射线衍射测量确定双轴晶体各向异性抗磁化率的简便方法。所提出的方法是基于这样一个事实，即在磁场下的结晶轴的波动幅度取决于相对于磁化率轴的场的方向。通过计算晶体在静磁场和旋转磁场下的磁能，确定了（hkl）晶面衍射光斑半宽与静磁场各向异性磁化率χ 1-χ 2和χ 2-χ 3以及旋转磁场各向异性磁化率χ 1-χ 2和χ 1-χ 3的关系，其中χ 1> χ 2> χ 3.我们已经证明，如果微晶的尺寸是已知的，则可以确定各向异性抗磁磁化率的绝对值，而如果微晶的尺寸是未知的，则只能确定比值（χ 2-χ 3）/（χ 1-χ 2）或（χ 1-χ 3）/（χ 1-χ 2）。
We present a facile method for determining the anisotropic diamagnetic susceptibility of biaxial crystals by performing X-ray diffraction measurements. The proposed method is based on the fact that the amplitude of fluctuations in a crystallographic axis under a magnetic field depends on the direction of the field with respect to the susceptibility axes. By calculating the magnetic energies of a crystal under static and rotating magnetic fields, we determined the relationship of the half-width of the diffraction spots corresponding to the (hkl) planes with the anisotropic magnetic susceptibilities χ 1-χ 2 and χ 2-χ 3 for the static field and χ 1-χ 2 and χ 1-χ 3 for the rotating field, where χ 1> χ 2> χ 3. We have shown that the absolute values of the anisotropic diamagnetic susceptibilities can be determined if the size of the microcrystals is known, whereas only the ratio (χ 2-χ 3)/(χ 1-χ 2) or (χ 1-χ 3)/(χ 1-χ 2) can be determined if the microcrystal size is unknown.