Quantification of the magnetic exchange via element-selective high-field magnetometry: Co-doped ZnO epitaxial films
Quantification of the magnetic exchange via element-selective high-field magnetometry: Co-doped ZnO epitaxial films
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DOI：
10.1103/physrevb.85.245202
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发表时间：
2012-06
影响因子：
3.7
通讯作者：
A. Ney;V. Ney;F. Wilhelm;A. Rogalev;K. Usadel
中科院分区：
文献类型：
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作者：
A. Ney;V. Ney;F. Wilhelm;A. Rogalev;K. Usadel
我们使用 X 射线磁圆二色性 (XMCD) 测量了具有高结晶完美度的 5、10 和 15Co 掺杂 ZnO 外延薄膜的元素比曲线。 XMCD 曲线在 17 T 时不会饱和，直接证明了相邻 Co 掺杂原子之间的反铁磁交换。角度相关的 XMCD 测量与基于完善的哈密顿量模型的理论计算相结合，可以定量确定下一个邻居交换以及单离子各向异性。而对于 5 和 10Co 掺杂，K 和 K，对于 15Co 掺杂，它们分别降至 10 和 2 K。因此，基于 XMCD 的高场元素选择性磁力测定法被证明是一种适合确定微观磁参数的技术，即使是在稀磁系统的外延薄膜中也是如此。
We have measured the element specificcurves for 5, 10, and 15Co-doped ZnO epitaxial films with high crystalline perfection using x-ray magnetic circular dichroism (XMCD). The XMCDcurves do not saturate up to 17 T directly evidencing antiferromagnetic exchange between neighboring Co dopant atoms. Angular-dependent XMCDmeasurements in combination with theoretical calculations based on a well-established model Hamiltonian allow to determine both the next-neighbor exchangeas well as the single ion anisotropyquantitatively. While for 5and 10Co doping,K andK, for 15Co doping, they are reduced to 10 and 2 K, respectively. High-field, element selective magnetometry based on XMCD is thus shown to be a suitable technique to determine microscopic magnetic parameters even in thin epitaxial films of dilute magnetic systems.