Enhanced material defect imaging with a radio-frequency atomic magnetometer
Enhanced material defect imaging with a radio-frequency atomic magnetometer
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DOI：
10.1063/1.5083039
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发表时间：
2019-03-07
影响因子：
3.2
通讯作者：
Chalupczak, W.
中科院分区：
文献类型：
--
作者：
Bevington, P.;Gartman, R.;Chalupczak, W.
通过监测材料对射频激励场的响应，可以用射频原子磁强计实现对材料中结构缺陷的成像。我们演示了两种测量配置，它们能够增加图像中的幅度和相位对比度，这些图像代表了导电和磁导样品中的结构缺陷。这两个概念都涉及从原子磁强计信号中消除与样品表面垂直的激发场分量。第一种方法依赖于一组线圈的实现，该线圈直接补偿磁力计信号中的激励场分量。第二种是利用射频磁强计对沿其一个轴振荡的磁场不敏感这一事实。简单模拟的结果证实了实验观察，并进行了详细的讨论。
Imaging of structural defects in a material can be realized with a radio-frequency atomic magnetometer by monitoring the material's response to a radio-frequency excitation field. We demonstrate two measurement configurations that enable the increase of the amplitude and phase contrast in images that represent a structural defect in electrically conductive and magnetically permeable samples. Both concepts involve the elimination of the excitation field component, orthogonal to the sample surface, from the atomic magnetometer signal. The first method relies on the implementation of a set of coils that directly compensates the excitation field component in the magnetometer signal. The second takes advantage of the fact that the radio-frequency magnetometer is not sensitive to the magnetic field oscillating along one of its axes. Results from simple modelling confirm the experimental observation and are discussed in detail.