A vacuum packaged surface micromachined resonant accelerometer
A vacuum packaged surface micromachined resonant accelerometer
复制标题
DOI:
10.1109/jmems.2002.805207
复制
发表时间:
2002-12-01
影响因子:
2.7
通讯作者:
Montague, S
中科院分区:
文献类型:
--
作者:
Seshia, AA;Palaniapan, M;Montague, S
This paper describes the operation of a vacuum packaged resonant accelerometer subjected to static and dynamic acceleration testing. The device response is in broad agreement with a new analytical model of its behavior under an applied time-varying acceleration. Measurements include tests of the scale factor of the sensor and the dependence of the output sideband power and the noise floor of the double-ended tuning fork oscillators as a function of the applied acceleration frequency. The resolution of resonant accelerometers is shown to degrade 20 dB/decade beyond a certain characteristic acceleration corner frequency. A prototype device was fabricated at Sandia National Laboratories and exhibits a noise floor of 40 mug/rootHz for an input acceleration frequency of 300 Hz.