X-ray CCD calibration system using fluorescent lines
X-ray CCD calibration system using fluorescent lines
复制标题
使用荧光线的 X 射线 CCD 校准系统
DOI：
10.1016/s0168-9002(00)00306-5
复制
发表时间：
2000
影响因子：
1.4
通讯作者：
T. Tsuru
中科院分区：
文献类型：
--
作者：
K. Hamaguchi;Y. Maeda;H. Matsumoto;M. Nishiuchi;H. Tomida;K. Koyama;H. Awaki;T. Tsuru
我们研制了一套CCD定标系统，利用能量范围从1.49 keV（Al Kα）到11.2 keV（Se Kα）的X射线荧光谱线。绝对X射线通量由气体正比计数器校准，而出现的光谱由固态硅探测器监测。为了抑制荧光光谱中的污染X射线，在X射线束线中设置机械准直器，使用高纯度的荧光线靶，并在X射线束线上放置带通滤波器。至于荧光X射线的纯度，达到的典型纯度为100%。
We have developed a CCD calibration system using fluorescent X-ray lines with energies ranging from 1.49 keV (Al Kα) to 11.2 keV (Se Kα). The absolute X-ray flux is calibrated by a gas proportional counter, while the emerging spectra are monitored by solid-state silicon detectors. In order to suppress contaminating X-rays in the fluorescence spectra, mechanical collimators were set in the X-ray beam line, high-purity targets for fluorescent lines were used, and band-pass filters were put on the X-ray beam line. As for the purity of the fluorescent X-rays, the typical purity achieved was ∼98%.