Current dependence of the magnetization rise time in thin film heads

Current dependence of the magnetization rise time in thin film heads
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薄膜磁头中磁化强度上升时间的电流依赖性

DOI：
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发表时间：
1997
期刊：
影响因子：
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通讯作者：
J. Stotz
J. Stotz
中科院分区：
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文献类型：
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作者：
M. R. Freeman;A. Elezzabi;J. Stotz

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现在可以以足够的分辨率进行磁化动力学的时域光学测量，以揭示与磁记录相关的许多结构的固有速度。在这里，我们描述了薄膜记录头空气轴承表面的磁化上升时间的行为，作为写入线圈中电流脉冲幅度的函数。间隙两侧磁化强度的空间分布也通过时间分辨、电流相关的测量来检查。通过固体浸没透镜增强空间分辨率，可以辨别数据中的域特征。
Time-domain optical measurements of magnetization dynamics can now be performed with sufficient resolution to reveal the intrinsic speed of many structures relevant to magnetic recording. Here we describe the behavior of the magnetization rise time at the air-bearing surface of a thin film recording head, as a function of the amplitude of current pulses in the write coil. The spatial profile of the magnetization on both sides of the gap is also examined through time-resolved, current dependent measurements. Spatial resolution enhancement via a solid immersion lens allows domain features to be discerned in the data.