Quantification of Yttria in Stabilized Zirconia by Raman Spectroscopy
Quantification of Yttria in Stabilized Zirconia by Raman Spectroscopy
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DOI：
10.1111/ijac.12434
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发表时间：
2016-01-01
影响因子：
2.1
通讯作者：
Nickel, Klaus G.
中科院分区：
文献类型：
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作者：
Hemberger, Yannick;Wichtner, Nadja;Nickel, Klaus G.
研究了四方相和立方相中Y_2O_3含量与拉曼光谱在约645/cm的位移之间的关系。随着Y_2O_3含量的增加，645/cm的拉曼频带位置降低到较低的拉曼移动值。X=13.66(40.69/(y-602，36)-1)(0.1976)，x=Y_2O_3含量(wt%)，y=拉曼谱带位置(以每厘米为单位)，对于低Y_2O_3稳定的t-ZrO_2，t‘-ZrO_2相变和完全稳定的c-ZrO_2是有效的。用Rietveld-Refined的X射线衍射法模拟了由于Y_2O_3掺杂而引起的晶格参数的变化，证实了Y_2O_3含量对晶格参数的影响主要是由于氧空位数量的变化。该方法在需要快速、空间分辨和无损分析的氧化锆材料中的Y2O_3的测定领域具有很高的吸引力。
The relationship between Y2O3 content in tetragonal and cubic ZrO2 phases and the shift of the Raman band at approximate to 645/cm was investigated. With increasing Y2O3 content, the 645/cm Raman band position decreases to lower Raman shift values. A fit of x=13.66(40.69/(y-602,36)-1)(0.1976), x=Y2O3 content in wt% and y=Raman band position in per cm, was found to be valid for low Y2O3-stabilized t-ZrO2, t ''-ZrO2 transition, and fully stabilized c-ZrO2. Modeling the change in lattice parameters due to the incorporation of Y2O3 in ZrO2 as obtained from Rietveld-refined XRD data confirms that the peculiar sigmoidal form of the band shift with Y2O3 content is mainly due to a variation of the amount of oxygen vacancies. The resultant method is highly attractive in fields of Y2O3 determination in ZrO2 materials where a fast, spatially resolved, and nondestructive analysis is required.