Calibrating the atomic balance by carbon nanoclusters
Calibrating the atomic balance by carbon nanoclusters
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DOI：
10.1063/1.3284498
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发表时间：
2010-12
期刊：
影响因子：
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通讯作者：
F. Song;Xuefeng Wang;R. Powles;Longbing He;N. Marks;Shifeng Zhao;J. Wan;Zongwen Liu;
中科院分区：
文献类型：
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作者：
F. Song;Xuefeng Wang;R. Powles;Longbing He;N. Marks;Shifeng Zhao;J. Wan;Zongwen Liu;
碳原子计数在近原子级精度使用扫描透射电子显微镜校准的碳纳米团簇质量标准。线性校准曲线控制着从几个碳原子到34000个原子的工作区域。这种线性使散射截面得到充分的平均，使实验具有接近原子水平的精度，尽管使用了粗糙的质量参考。这种方法的一个例子提供了薄层堆叠的石墨烯片。厚度低于100纳米的悬浮薄片被可视化，在光学和扫描探针方法无法达到的状态下提供定量测量。
Carbon atoms are counted at near atomic-level precision using a scanning transmission electron microscope calibrated by carbon nanocluster mass standards. A linear calibration curve governs the working zone from a few carbon atoms up to 34,000 atoms. This linearity enables adequate averaging of the scattering cross sections, imparting the experiment with near atomic-level precision despite the use of a coarse mass reference. An example of this approach is provided for thin layers of stacked graphene sheets. Suspended sheets with a thickness below 100 nm are visualized, providing quantitative measurement in a regime inaccessible to optical and scanning probe methods.