Fabrication of In-Doped ZnO Scintillator Mounted on a Vacuum Flange
Fabrication of In-Doped ZnO Scintillator Mounted on a Vacuum Flange
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DOI:
10.1109/tns.2012.2190145
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发表时间:
2012-10-01
影响因子:
1.8
通讯作者:
Fukuda, Tsuguo
中科院分区:
文献类型:
--
作者:
Kano, Masataka;Wakamiya, Akira;Fukuda, Tsuguo
High quality In-doped ZnO single crystal was grown using the hydrothermal method. The growth rate for both < 0001 > and < 000-1 > directions is about 80 mu m/day. The X-ray rocking curve (XRC) full width at half maximum (FWHM) of the (0002) reflection is 24.2 arcsec. In order to make it possible to use this material as a scintillator for in situ imaging of soft X-ray laser with high spatial resolution, we prepared an In-doped ZnO wafer (9.0 mm x 9.0 mm x 0.75 mm) and mounted it on a vacuum flange. The decay time constant is evaluated to be 120 ps, therefore making it an ideal scintillator for in situ imaging device of soft X-ray laser with high spatial resolution. Furthermore, In-doped ZnO scintillator with such short decay time constant is suitable for high accuracy alignment and synchronization of ultrafast, short wavelength laser sources for pump-and-probe experiments.