Survey of EUV Impurity Line Spectra and EUV Bremsstrahlung Continuum in LHD

Survey of EUV Impurity Line Spectra and EUV Bremsstrahlung Continuum in LHD
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DOI:
10.1585/pfr.6.2402078
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发表时间:
2011-07
影响因子:
0.8
通讯作者:
C. Dong;S. Morita;M. Chowdhuri;M. Goto
C. Dong;S. Morita;M. Chowdhuri;M. Goto
中科院分区:
--
文献类型:
--
作者:
C. Dong;S. Morita;M. Chowdhuri;M. Goto

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测量了大型螺旋器件(LHD)中杂质种子放电在极紫外(EUV)范围(60-400A)的杂质谱线发射的径向分布。氦、碳和霓虹等轻杂质的线发射位于边缘遍历层(1.0≤ρ≤1.2),但Cv和CVI位于0.8≤ρ≤1区域。而铁等重杂质的线发射则作为电离能的函数广泛地分布在整个等离子体区域。另一方面,用氢球注入的高密度放电的EUV谱也清楚地记录了韧致辐射连续辐射的径向分布。列出了可用于当前空间分辨EUV光谱仪系统绝对灵敏度校准的波长间隔,以及可用作波长标记的主线发射。
Radial profiles of impurity spectral line emissions in extreme ultraviolet (EUV) range (60-400 A) are surveyed for impurity seeded discharges in Large Helical Device (LHD). The line emissions from light impurities such as helium, carbon and neon are located in the edge ergodic layer (1.0 ≤ ρ ≤ 1.2) except for CV and CVI, which are located in region of 0.8 ≤ ρ ≤ 1. In contract, the line emissions from heavy impurities such as iron are widely located over the whole plasma region as a function of ionization energy. On the other hand, the radial profile of bremsstrahlung continuum radiation is also clearly recorded in the EUV spectrum observed from high-density discharges with hydrogen pellet injection. Wavelength intervals available for the absolute sensitivity calibration of the present space-resolved EUV spectrometer system are listed with dominant line emissions which are useful as a wavelength marker.