Generation of an X-ray microbeam for spectromicroscopy at SPring-8 BL39XU.

Generation of an X-ray microbeam for spectromicroscopy at SPring-8 BL39XU.
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在 SPring-8 BL39XU 上生成用于光谱显微镜的 X 射线微束。

DOI:
10.1107/s0909049500018446
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发表时间:
2001
影响因子:
2.5
通讯作者:
T. Hirokawa
T. Hirokawa
中科院分区:
物理与天体物理3区
文献类型:
--
作者:
S. Hayakawa;N. Ikuta;M. Suzuki;M. Wakatsuki;T. Hirokawa

文献摘要

被引文献

相似文献

在SPring-8BL 39 XU上设计并制作了一对椭圆镜(KB镜),用于实现能量可调谐X射线微束光谱显微镜。众所周知,非球面全反射镜可获得的光束尺寸受到反射镜斜率误差的强烈影响。考虑到来自SPring-8的波荡器辐射的极高亮度,采用小的反射镜尺寸和小的反射镜到焦点的距离来最小化斜率误差的影响。KB镜的初步评价进行了使用10千电子伏单色波荡器辐射。由闪烁体和CCD组成的束流监控系统辅助反射镜的准直,即使在光源完全使用的情况下,也可以容易地实现小于5微米的束流尺寸。该实验获得的光束尺寸为2 × 4微米2,光子通量为1 × 10(10)光子/秒。使用中间狭缝可以预期更小的光束尺寸。将使用X射线荧光(XRF)分析和X射线吸收精细结构(XAFS)测量与XRF产率方法进行空间分辨率的痕量元素表征。
A pair of elliptical mirrors (KB mirror) was designed and fabricated to realize an energy tunable x-ray microbeam for spectromicroscopy at SPring-8 BL39XU. As is commonly recognized, the obtainable beam size with the aspherical total reflection mirrors is strongly affected with the slope error of the mirror. Considering that the extremely high brilliance of the undulator radiation from the SPring-8, the small mirror size and the small mirror-to-focus distance were employed to minimize effects of the slope error. Preliminary evaluation of the KB mirror was carried out using 10 keV monochromatized undulator radiation. Alignment of the mirror was assisted by the beam monitor system composed of a scintillator and a CCD, and the beam size less than 5 microm can be easily achieved even when the source was fully used. The beam size obtained with this experiment was 2 x 4 microm2 with the photon flux of 1 x 10(10) photons/s. Smaller beam size may be expected with the use of intermediate slits. Characterization of trace elements with the spatial resolution will be carried out by using x-ray fluorescence (XRF) analysis and x-ray absorption fine structure (XAFS) measurements with XRF yield method.