Application of Image Analysis for TEM Image of Acceptor Graphite Intercalation Compound

Application of Image Analysis for TEM Image of Acceptor Graphite Intercalation Compound
复制标题

图像分析在受主石墨层间化合物TEM图像中的应用

DOI：
10.1080/10587250008025473
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发表时间：
2000
期刊：
Molecular Crystals and Liquid Crystals Science and Technology. Section A. Molecular Crystals and Liquid Crystals
影响因子：
--
通讯作者：
M. Dresselhaus
M. Dresselhaus
中科院分区：
--
文献类型：
--
作者：
T. Miyazaki;K. Oshida;M. Endo;M. Dresselhaus

文献摘要

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摘要利用高分辨透射电子显微镜（TEM），结合图像分析和模糊推理，提出了一种研究石墨层间化合物（GIC）微观结构的新方法。通过对CuCl 2-GIC进行使用二维（2D）快速傅立叶变换（FFT）的频率分析，得到与电子衍射图案类似的称为条纹的特征功率谱图案。通过2D逆FFT（IFFT）重建对应于特定频率的图像。然后研究了CuCl_2-GIC的阶结构。
Abstract A new approach to study of micro texture and structure of graphite intercalation compounds (GICs) is shown using high resolution transmission electron microscopy (TEM) combined with image analysis and fuzzy reasoning. As a result of application of the frequency analysis using 2-dimensional (2D) fast Fourier transform (FFT) to the CuCl2-GICs, a characteristic power spectrum pattern called streak, which is similar to an electron diffraction pattern, is obtained. The images correspond to the specific frequencies are reconstructed by 2D inverse FFT (IFFT). Then the stage structure of CuCl2-GICs is investigated.