Critical properties of the measurement-induced transition in random quantum circuits
Critical properties of the measurement-induced transition in random quantum circuits
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随机量子电路中测量引起的跃迁的关键特性
DOI:
10.1103/physrevb.101.060301
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发表时间:
2020
影响因子:
3.7
通讯作者:
Pixley, J. H.
中科院分区:
文献类型:
--
作者:
Zabalo, Aidan;Gullans, Michael J.;Wilson, Justin H.;Gopalakrishnan, Sarang;Huse, David A.;Pixley, J. H.
We numerically study the measurement-driven quantum phase transition of Haar-random quantum circuits indimensions. By analyzing the tripartite mutual information we are able to make a precise estimate of the critical measurement rate. We extract estimates for the associated bulk critical exponents that are consistent with the values for percolation, as well as those for stabilizer circuits, but differ from previous estimates for the Haar-random case. Our estimates of the surface order parameter exponent appear different from those for stabilizer circuits or percolation, but we cannot definitively rule out the scenario where all exponents in the three cases match. Moreover, in the Haar case the prefactor for the entanglement entropiesdepends strongly on the Rényi index; for stabilizer circuits and percolation this dependence is absent. Results on stabilizer circuits are used to guide our study and identify measures with weak finite-size effects. We discuss how our numerical estimates constrain theories of the transition.
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