Critical properties of the measurement-induced transition in random quantum circuits

Critical properties of the measurement-induced transition in random quantum circuits
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随机量子电路中测量引起的跃迁的关键特性

DOI:
10.1103/physrevb.101.060301
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发表时间:
2020
期刊:
影响因子:
3.7
通讯作者:
Pixley, J. H.
Pixley, J. H.
中科院分区:
物理与天体物理2区
文献类型:
--
作者:
Zabalo, Aidan;Gullans, Michael J.;Wilson, Justin H.;Gopalakrishnan, Sarang;Huse, David A.;Pixley, J. H.

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数值研究了一维Haar随机量子电路的测量驱动量子相变。通过分析三方互信息,我们能够作出一个精确的估计的临界测量率。我们提取估计相关联的散装临界指数是一致的渗流值,以及稳定器电路,但不同于以前的估计Haar随机的情况下。我们估计的表面序参数指数出现不同的稳定电路或渗流,但我们不能明确排除的情况下,所有的指数在三种情况下匹配。此外,在哈尔的情况下,纠缠熵的前因子强烈依赖于雷尼指数;稳定器电路和渗流这种依赖性是不存在的。稳定器电路上的结果被用来指导我们的研究和识别措施与弱有限尺寸效应。我们将讨论我们的数值估计如何约束理论的过渡。
We numerically study the measurement-driven quantum phase transition of Haar-random quantum circuits indimensions. By analyzing the tripartite mutual information we are able to make a precise estimate of the critical measurement rate. We extract estimates for the associated bulk critical exponents that are consistent with the values for percolation, as well as those for stabilizer circuits, but differ from previous estimates for the Haar-random case. Our estimates of the surface order parameter exponent appear different from those for stabilizer circuits or percolation, but we cannot definitively rule out the scenario where all exponents in the three cases match. Moreover, in the Haar case the prefactor for the entanglement entropiesdepends strongly on the Rényi index; for stabilizer circuits and percolation this dependence is absent. Results on stabilizer circuits are used to guide our study and identify measures with weak finite-size effects. We discuss how our numerical estimates constrain theories of the transition.
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