Fast and physically-accurate estimation of single event transient pulses from radiation-hlduced transient currents measured in a single MOSFET:a simulation-based case study in bulk CMOS logic circuits
Fast and physically-accurate estimation of single event transient pulses from radiation-hlduced transient currents measured in a single MOSFET:a simulation-based case study in bulk CMOS logic circuits
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从单个 MOSFET 中测得的辐射诱发瞬态电流中快速且物理准确地估计单粒子瞬态脉冲：体 CMOS 逻辑电路中基于仿真的案例研究
DOI：
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发表时间：
2007
期刊：
影响因子：
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通讯作者：
et. al.
中科院分区：
文献类型：
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作者：
D.Kobayashi;et. al.
