Quick measurement method of carbon-related defect concentration in n-type GaN by dual-color-sub-bandgap-light-excited isothermal capacitance transient spectroscopy
Quick measurement method of carbon-related defect concentration in n-type GaN by dual-color-sub-bandgap-light-excited isothermal capacitance transient spectroscopy
复制标题
双色亚带隙光激发等温电容瞬态光谱快速测量n型GaN中碳相关缺陷浓度的方法
DOI：
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发表时间：
2019
期刊：
影响因子：
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通讯作者：
Jun Suda
中科院分区：
文献类型：
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作者：
Kazutaka Kanegae;Tetsuo Narita;Kazuyoshi Tomita;Tetsu Kachi;Masahiro Horita;Tsunenobu Kimoto;Jun Suda
