Cross calibration of deformation potentials and gradient-elastic tensors of GaAs using photoluminescence and nuclear magnetic resonance spectroscopy in GaAs/AlGaAs quantum dot structures
Cross calibration of deformation potentials and gradient-elastic tensors of GaAs using photoluminescence and nuclear magnetic resonance spectroscopy in GaAs/AlGaAs quantum dot structures
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DOI:
10.1103/physrevb.97.235311
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发表时间:
2018-06-19
影响因子:
3.7
通讯作者:
Rastelli, A.
中科院分区:
文献类型:
--
作者:
Chekhovich, E. A.;Griffiths, I. M.;Rastelli, A.
Lattice matched GaAs/AlGaAs epitaxial structures with quantum dots are studied at T = 4.2 K under static uniaxial stress applied either along the [001] or [110] crystal directions. We conduct simultaneous measurements of the spectral shifts in the photoluminescence of the bulk GaAs substrate, which relate to strain via deformation potentials a and b, and the quadrupolar shifts in the optically detected nuclear magnetic resonance spectra of the quantum dots, which relate to the same strain via the gradient-elastic tensor S-ijkl. Measurements in two uniaxial stress configurations are used to derive the ratio b/a = 0.242 +/- 0.008 in good agreement with previous studies on GaAs. Based on the previously estimated value of a approximate to -8.8 eV we derive the product of the nuclear quadrupolar moment Q and the S-tensor diagonal component in GaAs to be QS(11)approximate to +0.758 x 10(-6) V for As-75 and QS(11) approximate to -0.377 x 10(-6) V for Ga-69 nuclei. In our experiments the signs of S u are directly measurable, which was not possible in the earlier nuclear acoustic resonance studies. Our QS(11) values are a factor of similar to 1.4 smaller than those derived from the nuclear acoustic resonance experiments [Phys. Rev. B 10, 4244 (1974)]. The gradient-elastic tensor values measured in this work can be applied in structural analysis of strained III-V semiconductor nanostructures via accurate modeling of their magnetic resonance spectra.