Novel imaging technique for non-destructive metrology and characterization of ultraviolet-sensitive polymeric microstructures
Novel imaging technique for non-destructive metrology and characterization of ultraviolet-sensitive polymeric microstructures
复制标题
用于紫外敏感聚合物微结构无损计量和表征的新型成像技术
DOI：
10.1063/1.5126957
复制
发表时间：
2020
影响因子：
1.6
通讯作者：
Saggere, Laxman
中科院分区：
文献类型：
--
作者：
Rountree, Corey M.;Ramkumar, Pradeep Kumar;Saggere, Laxman
