Patent quality and research productivity: Measuring innovation with multiple indicators
Patent quality and research productivity: Measuring innovation with multiple indicators
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DOI：
10.1111/j.1468-0297.2004.00216.x
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发表时间：
2004-04-01
期刊：
影响因子：
3.2
通讯作者：
Schankeman, M
中科院分区：
文献类型：
--
作者：
Lanjouw, JO;Schankeman, M
我们分析的研究生产率下降的决定因素，在美国制造业企业的面板数据在1980年至1993年。我们关注三个因素：需求水平、专利质量和技术枯竭。我们开发了一个专利“质量”的指标，使用详细的专利信息，并表明，使用多个指标大大减少了测量的质量方差。正如理论所预测的那样，公司层面的研究生产率与专利质量和需求水平呈负相关，而专利质量与公司的股票市场价值呈正相关。
We analyse the determinants of the decline in research productivity using panel data on manufacturing firms in the US for the period 1980-93. We focus on three factors: the level of demand, the quality of patents and technological exhaustion. We develop an index of patent 'quality' using detailed patent information and show that using multiple indicators substantially reduces the measured variance in quality. Research productivity at the firm level is inversely related to patent quality and the level of demand, as predicted by theory and patent quality is positively associated with the stock market value of firms.