The effect of wave-induced stress on current profiles
The effect of wave-induced stress on current profiles
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DOI：
10.1016/0029-8018(95)00058-5
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发表时间：
1996-10
影响因子：
5
通讯作者：
Z. You
中科院分区：
文献类型：
--
作者：
Z. You
本文研究了水平底上存在非破碎波时的流速剖面。特别考虑到从平均水面附近的标准对数剖面的测得的电流剖面的推导。这些偏差主要是由于波浪引起的二阶应力，而这在以前的模型中通常被忽略。现有的实验数据表明，波浪引起的二阶应力是高程的线性函数，并与波浪参数、水流强度和波流夹角有关。一个半经验模型的开发，并给出了良好的协议与实验测量的平均水面附近的电流剖面。
Current velocity profiles in the presence of non-breaking waves on a horizontal bottom are studied. Particular consideration is given to the derivations of measured current profiles from the standard logarithmic profiles near the mean water surface. The deviations are found to be due mainly to the wave-induced second-order stress which was generally neglected in the former models. The available experimental data indicate that the wave-induced second-order stress is a linear function of elevation and depends on the wave parameters, the current strength and the angle between the waves and the current. A semi-empirical model is developed and gives good agreements with experimental measurements of current profiles near the mean water surface.