In-situ fabrication of gold nanoparticle functionalized probes for tip-enhanced Raman spectroscopy by dielectrophoresis
In-situ fabrication of gold nanoparticle functionalized probes for tip-enhanced Raman spectroscopy by dielectrophoresis
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DOI：
10.1117/1.jnp.10.030502
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发表时间：
2016-07-01
影响因子：
1.5
通讯作者：
Notingher, Ioan
中科院分区：
文献类型：
--
作者：
Sweetenham, Claire S.;Woolley, Richard A. J.;Notingher, Ioan
我们报道了利用介电泳技术制备基于Au纳米颗粒的针尖增强拉曼光谱原位探针。一个典型的导电原子力显微镜（AFM）用于功能化铱涂层导电硅探针与Au纳米粒子的直径为10 nm。合适的TERS探针可以通过在1 MHz的频率下施加10 Vpp的电压来快速产生（30至120 s）。该技术的优点是，基于Au的探针可以立即用于TERS测量，从而最大限度地降低了处理过程中尖端污染和损坏的风险。使用扫描电子显微镜和能量分散x射线光谱来确认探针的质量，并使用银基底上的p-ATP单层样品来实验性地证明TERS测量。(C)作者。由SPIE根据知识共享归因3.0未移植许可证发布。
We report the use of dielectrophoresis to fabricate in-situ probes for tip-enhanced Raman spectroscopy (TERS) based on Au nanoparticles. A typical conductive atomic force microscope (AFM) was used to functionalize iridium-coated conductive silicon probes with Au nanoparticles of 10-nm diameter. Suitable TERS probes can be rapidly produced (30 to 120 s) by applying a voltage of 10 Vpp at a frequency of 1 MHz. The technique has the advantage that the Au-based probes are ready for immediate use for TERS measurements, minimizing the risks of tip contamination and damage during handling. Scanning electron microscopy and energy dispersive x-ray spectroscopy were used to confirm the quality of the probes, and used samples of p-ATP monolayers on silver substrates were used to demonstrate experimentally TERS measurements. (C) The Authors. Published by SPIE under a Creative Commons Attribution 3.0 Unported License.