High performance surface plasmon sensors: Simulations and measurements
High performance surface plasmon sensors: Simulations and measurements
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DOI：
10.1063/1.4929643
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发表时间：
2015-09-07
影响因子：
3.2
通讯作者：
Hozhabri, Nader
中科院分区：
文献类型：
--
作者：
Tiwari, Kunal;Sharma, Suresh C.;Hozhabri, Nader
通过计算机模拟和表面等离子体共振(SPR)测量，我们确定了设计和制造高灵敏度、高分辨率、高稳定性和长衰变长度的SPR传感器的最佳参数。我们给出了用双金属(Ag/Au)和多层波导耦合的Ag/Si3N4/Au结构制作的各种传感器的模拟和实验SPR数据。在MatLab环境下利用传递矩阵法进行了仿真。结果是金属(Ag或Au)厚度和用于Ag/Si3N4/Au结构的波导介质的函数。模拟结果与实验结果吻合较好。对于优化的Si3N4波导厚度(150 Nm)，该传感器对分析物折射率的变化表现出非常高的灵敏度，S-n接近52度/RIU，分辨率极高(半高宽=305 nm)(C)2015AIP出版有限责任公司。
Through computer simulations and surface plasmon resonance (SPR) measurements, we establish optimum parameters for the design and fabrication of SPR sensors of high sensitivity, resolution, stability, and long decay-length evanescent fields. We present simulations and experimental SPR data for variety of sensors fabricated by using bimetal (Ag/Au) and multilayer waveguide-coupled Ag/ Si3N4/Au structures. The simulations were carried out by using the transfer matrix method in MATLAB environment. Results are presented as functions of the thickness of the metal (Ag or Au) and the waveguide dielectric used in Ag/Si3N4/Au structures. Excellent agreement is observed between the simulations and experiments. For optimized thickness of the Si3N4 waveguide (150 nm), the sensor exhibits very high sensitivity to changes in the refractive index of analytes, S-n approximate to 52 degrees/RIU, extremely high resolution (FWHM = 305 nm) (C) 2015 AIP Publishing LLC.