Forward modeling method for microstructure reconstruction using x-ray diffraction microscopy: Single-crystal verification
Forward modeling method for microstructure reconstruction using x-ray diffraction microscopy: Single-crystal verification
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DOI：
10.1063/1.2400017
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发表时间：
2006-12
影响因子：
1.6
通讯作者：
R. Suter;D. Hennessy;C. Xiao;U. Lienert
中科院分区：
文献类型：
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作者：
R. Suter;D. Hennessy;C. Xiao;U. Lienert
我们描述并说明了一个定量重建的几何形状和取向的微观结构特征内的大体积样品从高能X射线衍射显微镜数据的正向建模方法。数据集包括源自样品的薄平面部分中的单个晶粒的布拉格衍射光束的电荷耦合器件图像。我们的分析方法首先将原始图像减少到二进制数据集，其中峰值在降噪处理后的高度的一小部分处被阈值化。然后，我们使用计算机模拟的测量和样品的微观结构，以产生计算的衍射图案在实验中使用的样品取向相同的范围内。调整样品空间中的每个区域元素阵列处的晶体取向，以优化实验散射和模拟散射之间的重叠。在本验证练习中，使用微聚焦……在高级光子源光束线1-ID处收集数据。
We describe and illustrate a forward modeling method for quantitatively reconstructing the geometry and orientation of microstructural features inside of bulk samples from high-energy x-ray diffraction microscopy data. Data sets comprise charge-coupled device images of Bragg diffracted beams originating from individual grains in a thin planar section of sample. Our analysis approach first reduces the raw images to a binary data set in which peaks have been thresholded at a fraction of their height after noise reduction processing. We then use a computer simulation of the measurement and the sample microstructure to generate calculated diffraction patterns over the same range of sample orientations used in the experiment. The crystallographic orientation at each of an array of area elements in the sample space is adjusted to optimize overlap between experimental and simulated scattering. In the present verification exercise, data are collected at the Advanced Photon Source beamline 1-ID using microfocused ...